OPTIV M DualScan i+
All-in-one metrology solution with two independent sensor axes
OPTIV M DualScan i+ offers measurement time improvements for an extended range of complex precision parts by deploying automatically exchangeable sensors in conjunction with an indexing probe head. This system guarantees optimum feature accessibility for large or heavy parts that must remain stationary within the measuring volume.
Training and Resources
OPTIV M DualScan i+ Specifications
| Available Size (X, Y, Z) | |
|---|---|
6.6.4 | |
| Accuracy | |
From 2.9 + L / 250) μm, E0,MPE₁ | |
| Probe type compatibility | |
Vision sensor Scanning probe Non-contact sensor (optical sensor) | |
| Automation ready | |
YES | |
| Temperature specification | |
18-22 °C |
₁ L = measuring length [mm]. Volumetric length measuring error according to ISO 10360-2:2009 at 18-22 °C
Take advantage of various learning opportunities
Visit the Nexus Academy Catalog for a complete list of educational content. You can enroll for training, complete self-paced courses, register for distance learning, classroom instruction, live training events, and download or print your completion certificate.
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Downloads are only available on the desktop version. Please access our site from a desktop to download.
This product does not offer any software downloads.
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