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GLOBAL Lite
GLOBAL Lite

A cost-effective and adaptable entry-point into automated dimensional inspection.

Investment in metrology can be a necessity for small-to-medium-sized enterprises that need to meet increasing customer demand. GLOBAL Lite is the ideal foundation for building up automated metrology capabilities.

The CMM offers the best price/performance ratio to meet initial budget and throughput requirements. With its simple configuration and user interface, GLOBAL Lite’s ease-of-use is perfect for quality professionals with less experience of using automated CMMs.

Device assessment available

Evaluate your device's health with Eclipse Compass.

This tool reviews your hardware's status and usage, providing a clear score and actionable insights. Instantly find out if your device is ready, needs service, or requires an upgrade, enabling informed decisions and minimizing downtime.

What does the Eclipse Compass offer?
  • check Personalized user roles and access control.
  • check Centralized docs and support.
  • check Purchasing and scheduling streamlined.
  • check Quick AI and expert support for issues.
  • check Proactive system health checks and alerts.

Training and Resources

GLOBAL Lite Specifications

Available size (X, Y, Z)​

07.07.05 / 07.10.07 / 09.12.08 / 09.15.08 / ​

09.20.08 / 12.15.10 / 12.12.10 / 12.30.10

Accuracy₁

From 1.9μm + L/300, MPE(E0/E150)₂) [18-22 °C]​

From 2.2μm + L/250, MPE(E0/E150)₂) [16-26 °C]

Probe type compatibility

Touch-trigger probe

Automation ready

YES

Temperature specification

18-22 °C (lab temperature)​

16-26 °C (extended temperature, option)

₁ According to ISO 10360-2 (2009)​
₂ MPE(E0/E150) specifications are to be formally understood as MPE(E0E150)* for the case where non-normal CTE material calibrated test lengths are used. Length unit measure (L) in mm

Our team is ready to help

Our technical support teams are on hand to answer your questions. Contact us through our online form and we will get right back to you.

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